无机盐工业
主管:中海油天津化工研究设计院有限公司
主办:中海油天津化工研究设计院有限公司
   中海油炼油化工科学研究院(北京)有限公司
   中国化工学会无机酸碱盐专业委员会
ISSN 1006-4990 CN 12-1069/TQ

无机盐工业 ›› 2010, Vol. 0 ›› Issue (12): 57-.

• 论文 • 上一篇    下一篇

四氟化硅气体中杂质的检测方法

唐安江,韦德举,高珊珊,关星宇   

  1. 贵州大学,贵州贵阳 550003
  • 发布日期:2011-04-18

Detecting methods for impurities in silicon tetrafluoride gas

Tang Anjiang,Wei Deju,Gao Shanshan,Guan Xingyu   

  1. Guizhou University,Guiyang 550003,China
  • Online:2011-04-18

摘要: 介绍了四氟化硅气体中几类杂质的检测方法,主要包括气相色谱法、傅里叶变换红外光谱法、质谱法和微波波谱法。用气相色谱仪可以检测出四氟化硅中气体中C1~C4碳氢化合物;用高分辨率傅里叶变换红外光谱仪可以检测出SiF3OH,HF,SiF3H,SiF2H2,SiH3F,CO2,CO等气体杂质;用微波波谱仪可以检测出四氟化硅中CHF3,CH2F2,CH3F等气体杂质;用质谱仪可以检测出四氟化硅中SiF3H,SiF2H2,SiF3OSiF3等气体杂质。通过对比得出每种检测方法的优点和缺点。

关键词: 四氟化硅, 气相色谱仪, 傅里叶红外光谱仪, 质谱仪, 微波波谱仪

Abstract: Detecting methods,including gas chromatography,Fourier transform infrared spectroscopy,mass spectrometry,and microwave spectroscopy,for several kinds of impurity in silicon tetrafluoride gas were introduced respectively.Gas chromatograph can detect C1~C4 hydrocarbons in silicon tetrafluoride gas;high-resolution Fourier transform infrared spectrometer can detect the impurity gases,such as SiF3OH,HF,SiF3H,SiF2H2,SiH3F,CO2 and CO;microwave spectrometer can detect the impurity gases,such as CHF3,CH2F2,and CH3F;and mass spectrometer can detect the impurity gases,such as SiF3H,SiF2H2,SiF3,and OSiF3.Advantages and disadvantages of each detecting method were found out by comparison at last.

Key words: silicon tetrafluoride, gas chromatograph, Fourier transform infrared spectrometer, mass spectrometer, microwave spectrometer

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